Thursday, 03 December 2020

Publications

 
  • Mukherjee, S.; Santra, P. K.; Sarma, D. D.,Depth Profiling and Internal Structure Determination of Low Dimensional Materials Using X-ray Photoelectron Spectroscopy, Hard X-ray Photoelectron Spectroscopy (HAXPES)  59, 309-339 (Springer Series in Surface Sciences , , 2015)