Seminar on Novel Lab based X-ray Spectroscopy Techniques fornon destructiveTrace Level Chemical Mapping (2D & 3D), Ultra ThinFilm Thickness Monitoring and Electronic State Characterization at Micron Resolution
2018-01-19 15:00 - 17:00 (Indian/Mahe) | Lecture Hall
Seminar
on
Novel Lab based X-ray Spectroscopy Techniques fornon destructiveTrace
Level Chemical Mapping (2D & 3D), Ultra ThinFilm Thickness Monitoring and
Electronic State Characterization at Micron Resolution
by
S H Lau
Vice President of Business Development, Sigray inc.
On
Friday, 19 January 2018
Time: 03.30 P.M.
Venue: Lecture Hall
This event was imported from: https://www.cens.res.in/hi/events/eventdetail/166/-/seminar-on-novel-lab-based-x-ray-spectroscopy-techniques-fornon-destructivetrace-level-chemical-mapping-2d-3d-ultra-thinfilm-thickness-monitoring-and-?tmpl=component
